Correlation Between Processing Map Domains and Microstructure of 50% Hot Compressed IMI 834 Ti Alloy

Kumar K, Basanth and Karre, Rajamallu and Dey, Suhash Ranjan (2016) Correlation Between Processing Map Domains and Microstructure of 50% Hot Compressed IMI 834 Ti Alloy. In: Proceedings of the 13th World Conference on Titanium, San Diego, USA.

Full text not available from this repository. (Request a copy)

Abstract

IMI 834 is a near alpha titanium alloy, extensively used for gas turbine engine applications such as high pressure compressor disc. It exhibits good fatigue and creep properties at elevated temperature (600°C) due to its bimodal microstructure but provides poor cold dwell fatigue life due micro‐texture regions in the bimodal microstructure. One can remove micro‐texture regions through proper high temperature processing at α+β region and can obtain random crystallographic oriented small grained bimodal microstructure. To generate this microstructure, hot compression tests are performed to determine optimized processing conditions by using thermo mechanical simulator (Gleeble 3800). Hot compression tests are carried out at five strain rates (0.001/s, 0.01/s, 0.1/s, 1/s and 10/s) and at five different temperatures (900°C, 950°C, 975°C, 1000°C and 1050°C) respectively up to 50% deformation. Further, processing map at 0.6 strains is developed using flow stress values from the true stress‐true strain curves. Processing map exhibits safe and unsafe domains with varying efficiency of power dissipation values. These safe and unsafe domains are correlated with microstructures and Disorientation distribution profiles of hot compressed specimens.

[error in script]
IITH Creators:
IITH CreatorsORCiD
Dey, Suhash Ranjanhttp://orcid.org/0000-0002-5148-9534
Item Type: Conference or Workshop Item (Paper)
Subjects: Materials Engineering > Materials engineering
Divisions: Department of Material Science Engineering
Depositing User: Team Library
Date Deposited: 23 Jul 2019 09:27
Last Modified: 23 Jul 2019 09:28
URI: http://raiith.iith.ac.in/id/eprint/5792
Publisher URL: http://doi.org/10.1002/9781119296126.ch53
Related URLs:

Actions (login required)

View Item View Item
Statistics for RAIITH ePrint 5792 Statistics for this ePrint Item