An efficient heuristic for peak capture power minimization during scan-based test

Satya Trinadh, A and Potluri, S and Sobhan Babu, Ch and Kamakoti, V (2013) An efficient heuristic for peak capture power minimization during scan-based test. Journal of Low Power Electronics, 9 (2). pp. 264-274. ISSN 1546-1998

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IR-Drop induced timing failures during testing can be avoided by minimizing the peak capturepower. This paper models the Capture-Power minimization problem as an instance of the Bottleneck Traveling Salesman Path Problem (BTSPP). The solution for the BTSPP implies an ordering on the input test vectors, which when followed during testing minimizes the Peak Capture-Power. The paper also presents a methodology for estimating a lower bound on the peak capture-power. Applying the proposed technique on ITC'99 benchmarks yielded optimal (equal to the estimated lower bound) results for all circuits. Interestingly, the technique also significantly reduced the average power consumed during testing when compared with commercial state-of-the-art tools

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IITH Creators:
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Item Type: Article
Uncontrolled Keywords: Binary Search; Bottleneck Biconnected Spanning Sub-Graph Problem (BBSSP); Bottleneck Traveling Salesman Path Problem (BTSPP); Design for Testability (DFT); Peak Capture-Power; Scan-Based Testing; Test Vector Ordering (TVO)
Subjects: Computer science > Big Data Analytics
Divisions: Department of Computer Science & Engineering
Depositing User: Team Library
Date Deposited: 27 Nov 2014 06:14
Last Modified: 27 Nov 2014 06:14
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