Micro-shear deformation of pure copper

Pfetzing-Micklich, J and Brinckmann, S and Dey, Suhash Ranjan and Otto, F and Hartmaier, A and Eggeler, G (2011) Micro-shear deformation of pure copper. Materials Science and Engineering Technology / Materialwissenschaft und Werkstofftechnik, 42 (3). pp. 219-223. ISSN 0933-5137

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In this paper a new micro-shear experiment is introduced using a double shear specimen machined by a focused ion beam technique. The micro-shear specimen is structured from pure copper promoting (111) [101] slip. Comparing scanning electron microscopy images before and after deformation provides evidence for localized shear. Load-displacement data identify a load plateau and characterize the localized shear process (critical shear-stress for activation of (111) [101] slip: 170 MPa).

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IITH Creators:
IITH CreatorsORCiD
Dey, Suhash Ranjanhttp://orcid.org/0000-0002-5148-9534
Item Type: Article
Uncontrolled Keywords: fokussierte Ionenstrahlung; Gleitsystem; Kupfer; Nanoindentation; Scherverformung
Subjects: Others > Metallurgy
Divisions: Department of Material Science Engineering
Depositing User: Team Library
Date Deposited: 07 Nov 2014 06:26
Last Modified: 07 Sep 2017 08:59
URI: http://raiith.iith.ac.in/id/eprint/641
Publisher URL: https://doi.org/10.1002/mawe.201100715
OA policy: http://www.sherpa.ac.uk/romeo/issn/0933-5137/
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