Characterization of microstructures using white light diffraction phase microscopy

Bansode, Vaibhav and John, Renu (2017) Characterization of microstructures using white light diffraction phase microscopy. In: IEEE International Conference on Power, Control, Signals and Instrumentation Engineering, 20th June 2018, Chennai India.

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Abstract

We present results from the characterization of microstructures using white light Diffraction Phase Microscopy technique, which combines the single shot imaging attributes of the off-axis geometry and speckle free imaging attribute of white light. A microscope with a halogen lamp and a Mach-Zehnder interferometer combined to obtain images of the specimen. A conventional phase reconstruction algorithm is applied to retrieve the phase information, which includes the unwrapping algorithm to avoid problem associated with the thick objects. We demonstrate 3D imaging and quantification of the depth of microstructures.

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IITH Creators:
IITH CreatorsORCiD
John, Renuhttps://orcid.org/0000-0003-3254-2472
Item Type: Conference or Workshop Item (Paper)
Uncontrolled Keywords: 3D imaging, Microscopy, microstructures, Quantitative phase imaging
Subjects: Biomedical Engineering
Divisions: Department of Biomedical Engineering
Depositing User: Team Library
Date Deposited: 06 Aug 2018 06:03
Last Modified: 06 Aug 2018 06:03
URI: http://raiith.iith.ac.in/id/eprint/4359
Publisher URL: http://doi.org/10.1109/ICPCSI.2017.8392146
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