Ambient Temperature-Induced Device Self-Heating Effects on Multi-Fin Si n-FinFET Performance

Sankatali, Venkateswarlu and Sudarsanan, Akhil and Singh, Shiv Govind and Nayak, Kaushik (2018) Ambient Temperature-Induced Device Self-Heating Effects on Multi-Fin Si n-FinFET Performance. IEEE Transactions on Electron Devices, 65 (7). pp. 2721-2728. ISSN 0018-9383

Full text not available from this repository. (Request a copy)

Abstract

Device self-heating effects (SHEs) in nonplanar Si MOS transistors such as fin field-effect transistors (FinFETs) and nanowire FETs have become a serious issue in designing well-tempered CMOS devices for future logic nodes. The device thermal contact resistances are strongly influenced by both the ambient temperature and within device lattice temperature. The ambient heat energy coupling through the thermal contact resistances will strongly impact device SHE in FinFETs due to increase in the surface-to-volume ratio of confined geometry thin Si Fin. In this paper, we report a 3-D quantum-corrected electrothermal numerical device analysis involving a coupled hydrodynamic and thermodynamic transport models for a target Si 3-Fin bulk n-FinFET. The numerical device simulations quantitatively predicted the impact of ambient and electrical contact temperatures on device short-channel effect immunity and performance. The simulation parameters are calibrated with the state-of-the-art Si FinFET measurement data from the literature. Our numerical simulation findings establish the phenomena of ambient temperature-induced device SHE on Si n-FinFETs performance for sub-14-nm technology nodes. The simulation predictions establish the fact that the thermal contact resistances and the within-chip ambient temperature (TA) have adverse effects on device lumped thermal resistance (Rth,eff) and performance metrics. Finally, we have numerically analyzed the FinFET design solutions (tapered source and drain regions) to improve the tolerance against the ambient temperature-induced SHE.

[error in script]
IITH Creators:
IITH CreatorsORCiD
Singh, Shiv Govindhttp://orcid.org/0000-0001-7319-879X
Nayak, KaushikUNSPECIFIED
Item Type: Article
Uncontrolled Keywords: Ambient temperature (TA)
Subjects: Electrical Engineering
Divisions: Department of Electrical Engineering
Depositing User: Team Library
Date Deposited: 13 Jul 2018 06:16
Last Modified: 13 Jul 2018 06:16
URI: http://raiith.iith.ac.in/id/eprint/4251
Publisher URL: http://doi.org/10.1109/TED.2018.2834979
OA policy: http://www.sherpa.ac.uk/romeo/issn/0018-9383/
Related URLs:

Actions (login required)

View Item View Item
Statistics for RAIITH ePrint 4251 Statistics for this ePrint Item